4 Point Probes
_4 Point Probes
_In the world of semiconductors, electrical measurement systems are crucial for measuring and monitoring sheet resistance and resistivity of thin films and bulk materials. For sheet resistance mapping systems, we offer 4-point probes with a variety of pin tip options, including different radii and spacing, to be used for various applications like metal measurements, implantation measurements or high impedance surface measurement. The 4-point probes we use provide a reliable and accurate way of measuring the sheet resistance of thin films and semiconductors. Replacement parts for our sheet resistance systems, including conditioning substrates and spare 4-point probes, are easily ordered online in our webstore. These replacement accessories can be used with both R50 and R54 4PP systems. With Filmetrics? 4-point probes, you can be assured that every measurement will be accurate and precise.
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CondWafer-4PP
Four point probe conditioning wafer pack.
$1276.79
4PP-TypeA
4PP probe with 1mm spacing, 40?m tip radius, 100gm. For metal measurements.
$2713.69
4PP-TypeB
4PP probe with 1mm spacing, 100?m tip radius, 100gm. For general purpose implantation measurement.
$2713.69
4PP-TypeC
4PP probe with 1mm spacing, 200?m tip radius, 100gm. For implant/high impedance surface measurement.
$2713.69
4PP-TypeD
4PP probe with 1mm spacing, 500?m tip radius, 100gm. For difficult implant/high impedance surface measurement.
$2713.69
4PP-TypeE
4PP probe with 1.6mm spacing, 40?m tip radius, 200gm. For substrate/bulk measurements.
$2713.69