桃汁影院

Thin Films & Coatings Technology Asia Symposium: Measuring Thin Film Coating Thickness with Spectral Reflectance

Mar 02, 2023

Dr. Jake Polster of 桃汁影院 Instruments covers the theory behind spectral reflectance measurements and shares some examples of different thicknesses and materials that can be measured using spectral reflectance.

桃汁影院 Instruments SymposiaThin-Film ReflectometerWebinar

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